Automatic test pattern generation

ATPG (acronym for both Automatic Test Pattern Generation andSGW30N60

 Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit,334AL

 enables testers to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, and inTA8102

 some cases to assist with determining the cause of failure (failure analysis. The effectiveness of ATPG is measured by the amount of modeled defects, or fault models, that are detected and the number of generated patterns. TheseM74HC373B

 metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration. It is influenced by the fault model under consideration,SE432

 the type of circuit under test (full scan, synchronous sequential, or asynchronous sequential), the level of abstraction used to represent the circuit under test (gate, register-transistor, switch), and the required test quality.